Semiconductors

Efficiency, Visibility and Quality

Critical Manufacturing is a SEMI member cmNavigo Productivity Suite is a new generation Agile Manufacturing Execution and Intelligence Solution, built end-to-end on proven Microsoft technology, delivering high-availability, performance and scalability while proving unique flexibility for modeling complex manufacturing scenarios at a very competitive Total Cost of Ownership (TCO). With a comprehensive functional coverage ranging from Equipment Integration and Manufacturing Operations Management to Data Analysis and Manufacturing Intelligence solutions, this Productivity Suite provides a one-stop-shop integrated solution for the most advanced Semiconductor manufacturing requirements.

Semiconductor manufacturers are amongst the earlier adopters of MES systems. Once vital to maintain the competitiveness of their operations, these applications are becoming a critical barrier to the constant demand for agility that these companies must have and will sooner or later impact their business.

While having all the necessary flexibility to model a variety of manufacturing environments from the most simple to very complex operations, cmNavigo Productivity Suite provides a complete set of easily configurable and smoothly integrated modules fulfilling the most challenging Efficiency, Visibility and Quality requirements.

Efficiency

Given the significant investment in cutting-edge production lines and the high-value WIP, semiconductor companies must continuously improve yield, cycle-time and equipment utilization to maintain their competitiveness. cmNavigo Productivity Suite provides a unique set of advanced functionality-rich modules, allowing manufacturers to continuously drive up operations efficiency.

Advanced Material Tracking

This core functionality includes all the necessary logic to track and trace materials in production lines, with a broad array of transactions, fully integrated with Resource Tracking, Container Management, Data Collection, SPC and Exception Management. The multi-level, high-automation ready, material model, material groups and position controlled container models allow the tracking of materials with sub-materials to any number of levels, enabling full traceability with low effort, including single-wafer tracking. Semiconductor-ready hierarchical flows with branches, rework paths, non-sequential and optional steps are used in configurable dispatching rules for material or resource priorities.

Recipe Management

A full-featured RMS module allows the management of hierarchical parameterized recipes with the necessary equipment information for job processing, management of recipe bodies with respective checksums and management of recipe parameters (constants, expressions, user inputs or advanced rules, including feed-forward and feed-back calculations). The module is a unified part of the Productivity Suite, providing recipe resolution and instantiation for a particular run of a material at a specific equipment; automatic recipe download, upload and select for equipment automation and recipe parameter overrides for specific contexts.

Advanced Data Collection

Advanced data collection, with flexible limits, dynamic samples, readings, groupings and calculations allows Manual, Automated or Mixed modes, as well as Immediate or Long-Running data collections. Collections are fully integrated with Statistical Process Control (SPC) and Exception Management.

Maintenance Management and Calibration

Ad-hoc (on-demand), time and usage based equipment maintenance management integrated with Material and Resource management. Microsoft Outlook calendar-like maintenance plans allow easy and interactive management of maintenance plans, including bill-of-parts and checklists per maintenance activity and spare parts inventory management, calibration procedures including specific guidance and limits for accuracy and precision. Records include equipment, operator, calibration date, next calibration date and other user defined fields.

Equipment Integration

cmConnect is an Equipment integration Framework module within cmNavigo, which allows an abstraction from the low-level equipment communication protocols and a tight integration to the MES layers. It comes with communication drivers like SECS/GEM or OPC, and allows easy addition of new ones. With a configurable and extensible service based architecture, contains several pre-configured automation scenarios, such as data collection and job management.

Visibility

Full visibility, traceability and business intelligence are paramount to address the challenges in today’s semiconductor environment. There can be no compromise: all information must be readily available, both at the detailed level and at different aggregation levels, for immediate reaction or more sophisticated decision making.

fabLIVE

fabLIVE allows easy design and deployment of a graphical fab layout to monitor the facilities, areas and equipment status in real time. With a GPS navigation-like technology, it provides an immediate overview about the status of production lines and allows the user to quickly zoom into the problem areas to find out all manufacturing details through history, chart or report widgets associated with the entities being analyzed.

Business Intelligence

A full set of Industrial Engineering reports is available out-of-the-box, with the typical semiconductor indicators like OEE, UPH, Cycle-time, Yield and Uptime, with no additional tools or implementation effort. Additionally, existing reports can be modified or new reports can be created and published on-the-fly, containing complex indicators, with drill-down capabilities and a mix of tables and charts. OLAP operations are done interactively in the system, recurring to a multi-dimensional data warehouse, allowing slicing & dicing operations. A data mining module provides advanced algorithms and analysis.

Traceability

Complete traceability is achieved through realistic modeling and the full or filtered history information of any object. Additionally, in areas with extensive use of splits, merges and assembles such as Backends, the genealogy consists of complex material trees, that are crucial for tracing the real span of a given problem. This functionality provides access to the full list of descendants or ascendants of any material in a tree format.

Dashboards

cmNavigo dashboards allow graphical access to online information. But the key aspect is that these are composed by widgets and can be easily created by end-users and shared with other users, for materials, resources or any other user defined query with online information in chart, report, table or graphical interactive modes. Additionally, the system allows for custom widgets to be created and added to the system to fulfill specific customer requirements.

Mapping

Among the semiconductor specific modules, the graphical representation of maps is an absolute requirement, fulfilled with cmNavigo integrated suite, as opposed to 3rd party tools. Interactive visualization of the maps enables rotations to match the screen orientation to the physical orientation of the wafer, or bin coloring rules, to highlight the different die grades. Pick rules and substrate maps definition can be imported and can be used with Die Bonders, Die Bonders, Die Sorters, Wafer Testers and any other substrate map, such as Burn-In board test results map (highlighting bins and bin grades) or tray maps.

Quality

cmNavigo Productivity Suite provides a modular, yet fully integrated, approach for the most challenging requirements of product life-cycle management, process control and quality improvement, going well beyond the traditional MES systems, encompassing Automation, Execution, Control, Engineering and Quality functions.

Exceptions Management

Advanced OCAPS or Quality protocols, based on user defined workflows, are used to model analysis, containment, corrective and preventive product or process actions. Protocols are automatically triggered by equipment, SPC rules, EDC limits or any MES action, or by manual operator decision. Each protocol includes mandatory or optional sequential or non-sequential steps, which may be assigned to different organizational roles. Each step has user defined fields, checklists and MES automatic or manual actions.

Documentation & Specification Management

All critical objects are change controlled with user-defined approval loops and a tightly controlled versioning system. Factory modeling and master data management may be performed interactively or using mass loading tools, drastically reducing project setup times. A documentation management module allows creating, updating, publishing and viewing documents with notifications and integrated with change control and associating and visualizing documents with material and resource contexts.

Advanced Layout and Printing

Interactively design, preview and print labels or electronic lot travelers, dynamically generated with context driven information for text, images or barcodes, in a combination of user inputs and automatically calculated data. Additionally, full traceability is enabled by both versioning of such documents as well as history of each print operation including an optional preview of what was printed.

Advanced Statistical Process Control

Online Statistical Process Control (SPC) includes variable & attribute charts, Western Electric and user defined rules. A holistic concept integrating Data Collection, Exceptions, Resource and Material Tracking: data automatically collected from the equipment, processed (calculation), posted into EDC, fed into SPC control charts (or simply having limits verified without SPC) and trigger quality protocols with automatic actions such as hold lot, put equipment down or notify responsible persons.

Electronic Failure Catalogue

Associating failure types with images and failing / acceptance criteria is facilitated through automatically generated failure catalogues. Operators access the catalogue in real-time, pre-filtered for the step, analyze the criteria and pick the applicable loss code from a matching picture. Fast and interactive navigation with deep zoom capability for high-definition images.

Overview

For a functional overview of cmNavigo, please

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Brochure

For more information about cmNavigo, please download the product brochure

cmNavigo brochure 3.01MB

Flyer

For more information about cmNavigo for semiconductor, please download the flyer

cmNavigo semiconductor flyer 2.81MB

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